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The horos enables high-sensitive measurements of the angle
resolved light scattering distribution of optical and non-optical
surfaces, coatings and materials at a wavelength of 660 nm in
a cone (half opening angle < 10°) around the specularly reflected
light of a sample.
The measurement of light scattering on technical surfaces and
optical components places high demands on the measurement technology.
A high dynamic range and linearity (at least 5 orders of magnitude)
must be adressable, in combination with high sensitivity (noise
equivalent ARS ~ 10 – 5 sr-1) corresponding to low
scatter losses and roughness at sub-nanometer level, as well
as with ultra-short measurements times (< 1s per measuring area).
In horos we combine all these top parameters in one system.
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Scheme of the scattering sensor
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